The ORION PLUS helium ion microscope

Image 1 of 1

By focusing helium ions into a beam, instead of electrons, the microscope can offer higher focus with lower sample damage.

Article Summary

Carl Zeiss SMT has introduced an improved version of its helium ion microscope at the Microscopy and Microanalysis 2008 exhibition: the ORION PLUS. By focusing helium ions into a beam, instead of electrons, the microscope can offer higher focus with lower sample damage.

« Back to The ORION PLUS helium ion microscope

ORION helium ion microscope
30th October, 2007
Carl Zeiss launches new MERLIN electron microscope
5th July, 2009
New microscope captures 3D movies of living cells
15th March, 2011
Tabletop X-ray device rivals world's largest machines
25th October, 2010
Multitouch gesture controlled microscope - the 'iPad on steroids'
28th March, 2011
An electron microscope that won't destroy living cells
7th October, 2009