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Instead of light, traditional high-resolution electron microscopes use a particle beam of electrons to illuminate a specimen. However, the particle beam also destroys the samples, meaning that electron microscopes can’t be used to image living cells. Electrical engineers at Massachusetts Institute of Technology (MIT) have proposed a new scheme that can overcome this critical limitation by using a quantum mechanical measurement technique that allows electrons to sense objects remotely without ever hitting the imaged objects, thus avoiding damage.
Read the full article: An electron microscope that won't destroy living cells